Chapter 3: Imaging

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3. Chapter 3: Imaging

part of

MSE672: Introduction to Transmission Electron Microscopy

Spring 2024

Gerd Duscher	Khalid Hattar
Microscopy Facilities	Tennessee Ion Beam Materials Laboratory
Materials Science & Engineering	Nuclear Engineering
Institute of Advanced Materials & Manufacturing
The University of Tennessee, Knoxville

Background and methods to analysis and quantification of data acquired with transmission electron microscopes.

The Imaging chapter has the following sections:

• Resolution Limit

Phase Contrast Imaging

• Contrast Transfer Function

• Linear Image Approximation

• Defocus Thickness Map

• Image Processing

Z-Contrast

• Thermal-Diffuse Scattering

• Z-Contrast Imaging

• Ronchigram

3.1. Navigation

• Back Chapter 2: Diffraction

• Next: Chapter 4: Spectroscopy

• List of Content: Front